EDS element mapping has undergone an evolution since the Spectral Imaging revolution enabled the automated extraction and plotting of X-ray counts from regions of interest within the X-ray spectrum.

The Pathfinder software platform begins with our advanced technique that stripes out the spectral background and separates overlapping peaks for elemental mapping.

The result is a concise EDS map where every element is uniquely and accurately represented.

The next step is to automatically quantify the spectrum within each pixel. This can be done in either standard mode or with the added accuracy of user collected standards.

The Pathfinder software platform solves problems where data sets with trace element distributions, or data sets with relatively few X-ray counts, often result in elemental maps that are noisy or results are cluttered and unclear.

A robust suite of X-ray imaging filters enables automatic smoothing, edge-finding and sharpening of the element maps. The result is clear EDS element maps, highlighting the key regions of interest within the data.

The final step is the ability to view element maps in topographical view. This mode brings out not only the natural topography of the sample but also the chemical topography of the associated elemental distributions.


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